Zhou Pengwu
1. College of Mechanical and Vehicle Engineering, Chongqing University,2. Engineering Research Center of Industrial Computed Tomography Nondestructive Testing, Ministry of Education,Chongqing UniversityXi Yarui
2. Engineering Research Center of Industrial Computed Tomography Nondestructive Testing, Ministry of Education, Chongqing University,3. Key Laboratory of Optoelectronic Technology and Systems,Ministry of Education, Chongqing UniversityZhu Guorong
2. Engineering Research Center of Industrial Computed Tomography Nondestructive Testing, Ministry of Education, Chongqing University,3. Key Laboratory of Optoelectronic Technology and Systems,Ministry of Education, Chongqing UniversityYuan Wei
2. Engineering Research Center of Industrial Computed Tomography Nondestructive Testing, Ministry of Education, Chongqing University,3. Key Laboratory of Optoelectronic Technology and Systems,Ministry of Education, Chongqing UniversityLiu Fenglin
1. College of Mechanical and Vehicle Engineering, Chongqing University, Chongqing 400044, China; 2. Engineering Research Center of Industrial Computed Tomography Nondestructive Testing, Ministry of Education, Chongqing University,3. Key Laboratory of Optoelectronic Technology and Systems,Ministry of Education, Chongqing UniversityTP391 TH74