小型CCD光谱仪波长定标精度控制与影响分析
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O433.4TH741

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2014年度国家公益性行业(气象)科研专项课题(GYHY201406037)项目资助


Accuracy control and influence analysis of wavelength calibration for compact CCD spectrometer
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    摘要:

    在光谱仪硬件性能基础上,波长定标是进一步引入误差的关键环节。若在定标方程系数固化过程中引入误差水平等同于像素采样误差,则在实际应用中波长测量误差就是在像素采样和波长定标方程计算环节上叠加引入2次误差,将造成测量误差的成倍扩大。以自主研制的小型光谱仪为基础,旨在通过数据分析研究波长定标环节中的影响因素,进而给出避免扩大误差的有效方法。所用的光谱仪在100 μm狭缝下半峰全宽(FHWM)约为5 nm,像素波长间隔约为045 nm,硬件系统的波长误差理论上为半像素波长间隔0225 nm。重点分析了测量噪声和峰位判定算法对定标精度的影响,并提出采用多次测量均值降噪结合高斯拟合峰位判定法来提高定标精度。与传统的直接极值法相比(定标方程均采用5次多项式),定标方程拟合残差的2倍标准差约为01 nm,传统直接极值峰位判定法下,定标方程拟合残差的2倍标准差为037 nm。通过研究,波长定标过程中的3个误差控制关键环节分别是测量噪声控制、峰位判定算法及最小二乘平差。通过选择适当的算法参数值,将波长定标拟合残差的标准差控制在约1/10 pixel波长间隔水平,充分体现了高斯拟合峰位判定算法的多像素统计优势。

    Abstract:

    On the base of hardware performance of spectrometer, wavelength calibration is the key process of further introducing errors. If the error level introduced in the solidification process of the calibration equation coefficients equals the pixel sampling error, then the wavelength measurement error in practical application includes two errors that comprises the pixel sampling error and the error introduced in the wavelength calibration equation calculation, which will enlarge and double the measurement error. Using the independently developed compact spectrometer, this paper aims to study the influence factors in wavelength calibration through data analysis, and then give an effective method to avoid error expanding. The FHWM of the adopted spectrometer is about 5 nm for a 100 μm slit, the wavelength interval of the pixels is about 045 nm, and the wavelength error of the hardware system is theoretically a halfpixel wavelength interval of 0225 nm. The influence of the measurement noise and peak finding algorithm on calibration accuracy is analyzed emphatically, and the averaging noise reduction with multimeasurements combined with Gauss fitting peak finding method is proposed to improve calibration accuracy. Compared with traditional direct extremum method, the 2 times standard deviationof the fitting residual of calibration equation for the proposed method is about 01 nm, while the 2 times standard deviation of the fitting residual of calibration equation for traditional direct extremum method is 037 nm (two methods both use the 5th order polynomial as the calibration equation). Study reveals that the three key factors of error control in wavelength calibration are measurement noise control, peak finding algorithm and least squares adjustment. Through selecting appropriate algorithm parameters, the standard deviation of the fitting residual of wavelength calibration can be controlled at the level of about 1/10 pixel wavelength interval, which fully reflects the multipixel statistical advantage of Gauss fitting peak finding algorithm.

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刘丽莹,李野,郑峰,张国玉,徐毅刚.小型CCD光谱仪波长定标精度控制与影响分析[J].仪器仪表学报,2019,40(5):19-27

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  • 在线发布日期: 2022-02-10
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