基于触头形貌特征的低压直流断路器可靠性评估
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1.河北工业大学省部共建电工装备可靠性与智能化国家重点实验室天津300130; 2.河北工业大学河北省电磁场与电器可靠性重点实验室天津300130

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TM61.1TP391.41TH89

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国家自然科学基金(52377142)项目资助


Reliability assessment of low-voltage DC circuit breaker based on morphological characteristics of contacts
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1.State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, (Hebei University-of Technology), Tianjin 300130, China; 2.Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province, Hebei University of Technology, Tianjin 300130, China

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    摘要:

    针对触头表面形貌的变化,提出了一种基于触头烧蚀区域形貌特征的可靠性评估模型。首先对触头的形貌演变过程及烧蚀机理进行分析,利用基于图像块权重改进的自适应多阈值分割算法进行触头图像分割,提取引弧板上熔融和喷溅部分作为感兴趣区域;分析感兴趣区域二值图的面积和质心,将其作为触头性能退化的两个关键特征量;对触头形貌变化特征进行分析,利用Gath-Geva(GG)模糊聚类算法得到断路器不同退化阶段的变点,由Copula函数建立了二元特征相关的多阶段Wiener退化模型,拟合优度KS值小于0.3,并通过低压直流断路器的电寿命实验进行模型的验证。

    Abstract:

    In this article, a reliability assessment model based on the morphology characteristics of the ablative region of the contacts is proposed for the change of surface morphology of the contacts. Firstly, the contact morphology evolution process and ablation mechanism are analyzed. The contact images are segmented using the adaptive multi-threshold segmentation algorithm based on the improvement of the image block weight, and the melting and splashing part of the arc-guiding plate is extracted as the region of interest. The area and center of mass of the binary map of the region of interest are analyzed as the two key features of the degradation of the contact performance. The change characteristics of the contact morphology are analyzed, and the change points of different degradation stages of circuit breakers are obtained by the Gath-Geva (GG) fuzzy clustering algorithm, and the multi-stage Wiener degradation model with binary feature correlation is formulated by Copula function. The goodness-of-fit of the KS test is less than 0.3, and the model is evaluated by the electric life experiments of low-voltage DC circuit breakers.

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李奎,张月,姜惠,侯天航,郭庆斌.基于触头形貌特征的低压直流断路器可靠性评估[J].仪器仪表学报,2024,45(12):118-128

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  • 在线发布日期: 2025-03-04
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