1.北京信息科技大学 光电信息与仪器北京市工程研究中心北京100016;2.现代测控技术教育部重点实验室北京100192;3.北京信息科技大学 光电测试技术北京市重点实验室北京100192
TH73
教育部“长江学者和创新团队”发展计划(IRT16R07)、北京市教委2015年度创新能力提升计划项目(TJSHG201510772016)、光电信息与仪器北京市工程研究中心开放课题(GD2016008)项目资助
Zhang Wen
1.Beijing Engineering Research Center of Optoelectronic Information and Instruments, Beijing Information Science and Technology University,Beijing 100016,China;2. Key Laboratory of Modern Measurement Control Technology,Ministry of Education,Beijing 100192,China; 3. Beijing Key Laboratory of Optoelectronic Test Technology, Beijing Information Science and TechnologyUniversity,Beijing 100192,ChinaLiu Xiaolong
1.Beijing Engineering Research Center of Optoelectronic Information and Instruments, Beijing Information Science and Technology University,Beijing 100016,China;2. Key Laboratory of Modern Measurement Control Technology,Ministry of Education,Beijing 100192,China; 3. Beijing Key Laboratory of Optoelectronic Test Technology, Beijing Information Science and TechnologyUniversity,Beijing 100192,ChinaHe Wei
1.Beijing Engineering Research Center of Optoelectronic Information and Instruments, Beijing Information Science and Technology University,Beijing 100016,China;2. Key Laboratory of Modern Measurement Control Technology,Ministry of Education,Beijing 100192,China; 3. Beijing Key Laboratory of Optoelectronic Test Technology, Beijing Information Science and TechnologyUniversity,Beijing 100192,ChinaZhu Lianqing
1.Beijing Engineering Research Center of Optoelectronic Information and Instruments, Beijing Information Science and Technology University,Beijing 100016,China;2. Key Laboratory of Modern Measurement Control Technology,Ministry of Education,Beijing 100192,China; 3. Beijing Key Laboratory of Optoelectronic Test Technology, Beijing Information Science and TechnologyUniversity,Beijing 100192,China1.Beijing Engineering Research Center of Optoelectronic Information and Instruments, Beijing Information Science and Technology University,Beijing 100016,China;2. Key Laboratory of Modern Measurement Control Technology,Ministry of Education,Beijing 100192,China; 3. Beijing Key Laboratory of Optoelectronic Test Technology, Beijing Information Science and TechnologyUniversity,Beijing 100192,China
张雯,刘小龙,何巍,祝连庆. LPFG和FBG级联结构双参数光纤传感器研究[J].仪器仪表学报,2017,38(8):2047-2054
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